Scanning Probe Microscopy: Atomic Force Microscopy and Scanning Tunneling Microscopy (NanoScience and Technology)
4.2 (23 items)
Limited Time SaleUS$89.11 cheaper than the new price!!
Free cash-on-delivery fees for purchases over $99
Product details
| Management number | 233378953 | Release Date | 2026/06/27 | List Price | US$59.41 | Model Number | 233378953 | ||
|---|---|---|---|---|---|---|---|---|---|
| Category | |||||||||
This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field. Read more
| ASIN | B00TZIO1M6 |
|---|---|
| XRay | Not Enabled |
| ISBN13 | 978-3662452400 |
| Edition | 2015th |
| Language | English |
| File size | 18.2 MB |
| Page Flip | Enabled |
| Publisher | Springer |
| Word Wise | Enabled |
| Print length | 678 pages |
| Accessibility | Learn more |
| Screen Reader | Supported |
| Publication date | February 24, 2015 |
| Enhanced typesetting | Enabled |
Bestseller ranking
Reducers
Customers who viewed this product also viewed
Nanostructures
Correction of product information
If you notice any omissions or errors in the product information on this page, please use the correction request form below.
Correction Request Form